“Thin film materials - theory and applications” - PCAM

The summer school is a side event to the ‘European Conference on Surface Science – ECOSS 2023’

Topics:

1. Density Functional Theory, Introduction and practical computational examples
2. Chemical reactions on surfaces – catalysis
3. Surface analysis
4. Applications of ML Based Techniques for Material Characterization at Nano and Atomic Scale
5. 2D materials
6. Layered materials as solid lubricants

Students will earn a certificate for participating in the plenary talks of the conference and afterwards following the school tracks. The certificate can be presented to the student’s University to gain ECTS points (up to 3 ECTS) for the School.
There will be a poster session where the students present their posters together with the ECOSS poster session.

Local Organizing Committee:
Franciszek Krok, Benedykt R. Jany, Jagiellonian University in Krakow, Poland.
E-mail: franciszek.krok@uj.edu.pl.

Here you will find our School Poster.

1. Participation in the school is free.
2. To participate in the school, check the appropriate checkbox during registration.
3. The number of places is limited.

The PCAM (Physics and Chemistry of Material Sciences) network was founded in 2006 by Gian Paolo Brivio and colleagues. At present the network has 15 member universities and associated industries spread over Europe. It is led by SDU (Horst-Günter Rubahn) and hosts an annual summer school. Apart from the summer school, exchange of students is a major interest of the network. Partners of PCAM cooperate to enable student exchange. Successful students are offered a European doctorate certificate if their CVs fulfill certain requirements. Interested students can find more information on the webpage. It is always welcomed to contact directly members of PCAM.

“Surface Science Toolbox 2023” - IUVSTA School on Surface Science Techniques

23–26 August 2023, Poznań, Poland

Are you a PhD student or an early-career researcher in surface science?
Attend lectures and laboratory courses given by specialist in the field!

1. Auger and X-ray Photoelectron Spectroscopy (XPS/AES) (incl. data fitting)
   by Dr. John. T. Grant (SurfaceAnalysis) and Prof. Dr. Leszek Markowski (UniWrocław)
2. Inverse and Ultraviolet Photoemission Spectroscopy (IPES/UPS)
   by Prof. Dr. Jennifer MacLeod (QUT)
3. Low Energy and Reflection High Energy Electron Diffraction (LEED/RHEED)
   by Dr. John. T. Grant (SurfaceAnalysis) and Dr. Osvaldo de Melo (UniHavana)
4. Secondary Ion Mass Spectrometry (SIMS) and Atom Probe Tomography
   by Dr. Michael Wahl (UniKaiserslautern)
5. Ion Beam Analysis Techniques
   by Dr. Marko Karlušić (Ruđer Bošković Institute)
6. Scanning Tunneling Microscopy and Spectroscopy (STM/STS)
   by Prof. Dr. Mikołaj Lewandowski (AMU) and Prof. Dr. Ryszard Czajka (PUT)
7. Energy- and Wavelength-Dispersive Spectroscopy (EDS/WDS)
   by Dr. Stanislav Haviar (UniPilsen)
8. Density Functional Theory (DFT) calculations of surfaces
   by Dr. Elwira Wachowicz (UniWrocław)

… and more!

Here you will find our School Poster.
Website of our school: sst2023.surfacescience.pl.

“Surface Analyses with X-ray Photoelectron Spectroscopy” - John T. Grant

This course has been cancelled

XPS is used to determine the atoms present at a surface and their concentrations, chemistry, and lateral and depth distributions. This course emphasizes:

1. Introduction about surfaces;
2. terminology;
3. principles of XPS (production of photoelectrons, peak labeling, electronic configuration of atoms, atoms, molecules, solids, binding energy, spectra, Auger process, valence spectra, handbooks, books, surface sensitivity, information depth, hard X-rays, sample handling, spin-orbit splitting, chemical shift, plasmons, multiplet splitting, shake-up);
4. instrumentation;
5. small area analysis;
6. imaging XPS;
7. near-atmospheric pressure XPS;
8. Auger parameter;
9. qualitative analysis;
10. detection limits;
11. charge control;
12. quantitative analysis;
13. peak identification and errors;
14. artifacts;
15. lineshapes;
16. background;
17. curve fitting;
18. depth profiling (non-destructive and destructive methods), angle resolved XPS;
19. general summary